HUSSEIN K. MEJBEL; ABDULRIDA, P. M. Dielectric Reduction of Nanometric Amorphous Silicon. Al-Salam Journal for Engineering and Technology, [S. l.], v. 1, n. 1, p. 11–19, 2022. DOI: 10.55145/ajest.2022.01.01.002. Disponível em: https://journal.alsalam.edu.iq/index.php/ajest/article/view/6. Acesso em: 24 nov. 2024.